Analytical Design of Total-Internal-Reflection Grating Demultiplexers With a Low Noise Floor
Analytical Design of Total-Internal-Reflection Grating Demultiplexers With a Low Noise Floor
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DOI：
10.1109/lpt.2010.2052597
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发表时间：
2010-06
影响因子：
2.6
通讯作者：
Jun-Hwa Song;Jinfei Ding
中科院分区：
文献类型：
--
作者：
Jun-Hwa Song;Jinfei Ding
以硅纳米线为衬底，从理论上设计了具有低噪声底面的全内反射面刻蚀衍射栅(EDG)解复用器。基于傅立叶分析，推导了EDG解复用器的传递函数。由于Goos-Hänchen漂移和小面尺寸的有限导致了具有TIR小面的EDG解复用器的大部分损耗，因此我们可以通过稍微调整每个光栅面的大小和结构来将传输函数重塑为近似的高斯分布。因此，我们设计了一种基于硅波导的具有极低噪声底板的EDG解复用器。
Etched diffraction grating (EDG) demultiplexers using total-internal-reflection (TIR) facets with a low noise floor have theoretically been designed based on silicon nanowire wafers. The transfer function (TF) of EDG demultiplexers is derived based on Fourier analysis. Since the Goos-Hänchen shift and the finite size of facets result in most of the loss of EDG demultiplexers with TIR facets, we can reshape the TF into an approximate Gaussian distribution by slightly adjusting each grating facet's size and structure. Thus, we design an EDG demultiplexer with a very low noise floor based on silicon waveguide.