Thermally activated dewetting of organic thin films: the case of pentacene on SiO2 and gold
Thermally activated dewetting of organic thin films: the case of pentacene on SiO2 and gold
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DOI：
10.1007/s00339-008-5011-3
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发表时间：
2009-04-01
影响因子：
2.7
通讯作者：
Witte, G.
中科院分区：
文献类型：
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作者：
Kaefer, D.;Woell, C.;Witte, G.
用多技术手段研究了用有机分子束沉积(OMBD)方法在SiO_2和Au(111)表面沉积并五苯类有机薄膜的表面形貌。应用的技术包括X射线光电子能谱(XPS)、原子力显微镜(AFM)、扫描电子显微镜(SEM)和热脱附谱(TDS)。我们比较详细的研究表明，在这两种衬底上，生长都受到去湿和孤岛现象的强烈影响，产生了非常粗糙的表面。令人惊讶的是，在几个小时的时间尺度上，在室温样品上沉积后，也观察到了形貌的实质性变化。在一个简单模型的框架内分析了相当广泛的现场XPS数据集，这使得我们能够得到关于粗糙度参数的相当详细的信息。
The morphology of pentacene organic thin films deposited on SiO2 and Au(111) surfaces using organic molecular beam deposition (OMBD) has been characterized by a multi-technique approach. Among the techniques applied were X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), scanning electron microscopy (SEM) and thermal desorption spectroscopy (TDS). Our rather detailed studies reveal that on both substrates the growth is strongly influenced by dewetting and islanding phenomena, yielding very rough surfaces. Surprisingly, substantial changes in the morphology were observed also after deposition on room-temperature samples on a time scale of several hours. The rather extensive set of in situ XPS data was analyzed in the framework of a simple model, which allows us to derive rather detailed information on the roughness parameters.