Electron injection into hole-transporting layer from emission layer in organic light emitting diodes
Electron injection into hole-transporting layer from emission layer in organic light emitting diodes
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有机发光二极管中电子从发射层注入空穴传输层
DOI:
10.1002/pssc.201084048
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发表时间:
2011
期刊:
影响因子:
--
通讯作者:
他4名
中科院分区:
文献类型:
--
作者:
T. Tsuboi;他4名
Optical and electrical characteristics of organic light emitting diode devices with emitting layer of N,N′‐di(naphthalene‐1‐yl)‐N,N′‐diphenyl‐benzidine (NPB) doped with 0.2, 0.5, and 1.0% tris[1‐phenylisoquinolinato‐C2, N] iridium [Ir(piq)3] are presented. Tris(8‐hydroxyquinoline) aluminum (Alq3) and NPB were used as electron and hole transport layers, respectively. Emissions from Ir(piq)3dopant and Alq3have been observed in all the devices. No emission from NPB host was observed even in device with 0.2% dopant concentration. This is understood by the high HOMO gap (0.8 eV) between NPB and Alq3and by the very small HOMO gap (0.1 eV) between Ir(piq)3and Alq3, which do not lead to injection of electrons from Alq3electron transport layer into NPB host in emitting layer but lead to direct injection of electrons from Alq3into Ir(piq)3. It was found that the driving voltage, external quantum efficiency, and luminous efficiency increase with increasing dopant concentration, but power efficiency decrease. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)