Transient impurity events in JET with the new ITER-like wall
Transient impurity events in JET with the new ITER-like wall
复制标题
JET 中的瞬态杂质事件与新的类似 ITER 的壁
DOI：
10.1088/0031-8949/2014/t159/014014
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发表时间：
2014
期刊：
影响因子：
2.9
通讯作者：
J. Coenen
中科院分区：
文献类型：
--
作者：
M. Sertoli;J. C. Flannegan;A. Cackett;E. Hodille;P. D. de Vries;I. Coffey;B. Sieglin;S. Marsen;S. Brezinsek;G. Matthews;J. Coenen
瞬态杂质事件导致辐射功率的意外增加已在JET从ITER的安装墙进行了研究。共检测到超过2800个等离子体放电的1800个事件。没有一项导致血浆条件的永久性变化。在所有事件中，60%的事件显示出来自因科镍合金或钢结构的痕量W和25%的Ni、Fe或Cr。它们主要发生在转向磁配置，独立的罢工点的位置。使用汤姆逊散射诊断和相关的瞬态杂质事件的发生中断尘埃再分布的影响进行了研究。检测到的灰尘事件的数量增加与中断力，并在比较的全C墙，灰尘动员的量被发现是低约一个数量级。它们的时间演化与瞬态杂质事件的时间演化有很好的相关性。
Transient impurity events leading to an unexpected increase in radiated power have been studied in JET from the installation of the ITER-like wall. A total of 1800 events over 2800 plasma discharges have been detected. None have led to permanent changes in the plasma conditions. Of all the events 60% show traces of W and 25% of either Ni, Fe or Cr from either Inconel or steel structures. They occur mainly in diverted magnetic configuration, independently of strike-point position. The effect of disruptions on dust redistribution has been investigated using the Thomson scattering diagnostic and correlated with transient impurity event occurrence. The number of dust events detected increases with disruption force and, in comparison to the full-C wall, the amount of dust mobilized is found to be about an order of magnitude lower. Their time evolution correlates well with that of the transient impurity events.
影响因子：
2.2
作者：
P. Vries;G. Arnoux;A. Huber;J. Flanagan;M. Lehnen;V. Riccardo;C. Reux;S. Jachmich;C. Lowry;G. Calabrò;D. Frigione;M. Tsalas;N. Hartmann;S. Brezinsek;M. Clever;D. Douai;M. Groth;T. Hender;E. Hodille;E. Joffrin;U. Kruezi;G. Matthews;J. Morris;R. Neu;V. Philipps;G. Sergienko;M. Sertoli;J. Contributors
通讯作者：
P. Vries;G. Arnoux;A. Huber;J. Flanagan;M. Lehnen;V. Riccardo;C. Reux;S. Jachmich;C. Lowry;G. Calabrò;D. Frigione;M. Tsalas;N. Hartmann;S. Brezinsek;M. Clever;D. Douai;M. Groth;T. Hender;E. Hodille;E. Joffrin;U. Kruezi;G. Matthews;J. Morris;R. Neu;V. Philipps;G. Sergienko;M. Sertoli;J. Contributors