Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method
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DOI：
10.1063/1.1834999
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发表时间：
2004-12
期刊：
Applied Physics Letters
影响因子：
4
通讯作者：
A. Simões;A. Ries;F. M. Filho;C. Riccardi;J. Varela;E. Longo
A. Simões;A. Ries;F. M. Filho;C. Riccardi;J. Varela;E. Longo
中科院分区：
物理与天体物理2区
文献类型：
--
作者：
A. Simões;A. Ries;F. M. Filho;C. Riccardi;J. Varela;E. Longo

文献摘要

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相似文献

无疲劳 Bi3.25La0.75Ti3O12 (BLT) 薄膜在 LaNiO3、RuO2 和 La0.5Sr0.5CoO3 底部电极上在微波炉中在 700 °C 下生长 10 分钟。剩余极化率（Pr）和驱动电压（Vc）分别在11-23μC/cm2和0.86-1.56 V范围内，优于文献中的值。 BLT 电容器在 1010 个读/写开关周期内没有表现出任何明显的疲劳。
Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3,RuO2, and La0.5Sr0.5CoO3 bottom electrodes in a microwave furnace at 700 °C for 10 min. The remanent polarization (Pr) and the drive voltage (Vc) were in the range of 11–23μC∕cm2 and 0.86–1.56 V, respectively, and are better than the values found in the literature. The BLT capacitors did not show any significant fatigue up to 1010read∕write switching cycles.