High frequency dielectric properties of A5B4O15 microwave ceramics
High frequency dielectric properties of A5B4O15 microwave ceramics
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DOI：
10.1063/1.1351873
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发表时间：
2001-04-07
影响因子：
3.2
通讯作者：
Mohanan, P
中科院分区：
文献类型：
--
作者：
Kamba, S;Petzelt, J;Mohanan, P
采用微波谐振腔技术、远红外反射透射光谱和时间分辨太赫兹透射光谱研究了A（5）B（4）O（15）（A=Ba，Sr，Mg，Zn，Ca; B=Nb，Ta）介质陶瓷的高频介电性能。微波介电常数ε ′和Qxf因子根据化学组成而变化，分别在11和51以及2.4和88 THz之间。温度系数τ（f）在-73和232 ppm/℃之间变化，并且在平行于τ（f）的两个样品中平行于小于15 ppm/℃。结果表明，所研究的陶瓷的微波介电常数ε '是由极性声子贡献决定的，亚毫米波介质损耗ε'线性外推到微波区与单相样品的微波数据一致。讨论了声子谱、晶体结构和晶胞体积之间的关系。(C)2001年美国物理学会。
High-frequency dielectric properties of A(5)B(4)O(15) (A=Ba, Sr, Mg, Zn, Ca; B=Nb, Ta) dielectric ceramics are studied by means of the microwave cavity technique, a combination of far-infrared reflection and transmission spectroscopy and time-resolved terahertz transmission spectroscopy. Microwave permittivity epsilon' and Qxf factor vary, depending on the chemical composition, between 11 and 51, and 2.4 and 88 THz, respectively. The temperature coefficient tau (f) varies between -73 and 232 ppm/degreesC, and in two samples parallel to tau (f)parallel to is less than 15 ppm/degreesC. It is shown that the microwave permittivity epsilon' of the ceramics studied is determined by the polar phonon contributions and that linear extrapolation of the submillimeter dielectric loss epsilon' down to the microwave region is in agreement with the microwave data of single phase samples. The relationship among phonon spectra, the crystal structure, and the unit cell volume is discussed. (C) 2001 American Institute of Physics.