Charge-transfer processes in semiconductor colloids

Charge-transfer processes in semiconductor colloids
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半导体胶体中的电荷转移过程

DOI:
10.1117/12.17896
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发表时间:
1990
期刊:
--
影响因子:
--
通讯作者:
K. R. Gopidas
K. R. Gopidas
中科院分区:
--
文献类型:
--
作者:
P. Kamat;K. R. Gopidas

文献摘要

被引文献

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A picosecond transient absorption spectroscopy technique has been employed to probe the charge transfer processes in Ti02 semiconductor colloids. The trapping of electrons at the TiO surface (Ti4+ sitesY was characterized from the appearance of a broad absorption in the region of 550-750 nm following the 355-nm laser pulse excitation of Ti02 colloids. The lifetime of these trapped charge carriers increased upon incorporation of a hole scavenger in the colloidal semiconductor system. The mechanistic and kinetic details of the charge injection from excited CdS into a large bandgap semiconductor such as AgI and Ti02 have also been inves-' t i ga ted.