Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
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DOI：
10.1016/j.microrel.2013.04.002
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发表时间：
2013-07-01
影响因子：
1.6
通讯作者：
de Vries, H.
中科院分区：
文献类型：
--
作者：
Jablonski, M.;Bossuyt, F.;de Vries, H.
对可靠、可变形的电子系统的追求采取了两条主要途径，要么利用导电弹性体，要么利用金属导体。在后者的情况下，机械坚固性权衡，以换取金属导体本身的低电阻率，允许实现电力要求高和大面积的应用(例如，协调照明和标牌)。机械上的取舍源于金属导体在无故障的情况下无法获得显著的延伸率。目前使金属导体能够在弹性介质中无故障运行的许多尝试之一是SMI(可伸缩模压互连)，这是在CMST开发的一种与印刷电路板兼容的技术。它的概念依赖于嵌入柔软弹性材料中的平面内蜿蜒的金属轨道。这项工作集中于这种互连最简单形式的循环、单轴拉伸耐久性和可靠性评估(威布尔分析)-利用嵌入PDMS(聚二甲基硅氧烷)的无支撑、曲折的铜轨。轨道被评估为在柔性(不可拉伸)区域之间终止的短互连(几个弯曲波长长)，以结合弯曲-拉伸过渡机制对可靠性的影响。这是一项重要的评估，用于优化实际应用中的互连几何结构，在这些应用中，弯曲-拉伸转变将是不可避免的，并且反复变形下的可靠性是重要的(例如，用于纺织集成的可伸缩电路)。人们试图通过渐变来加固曲折的几何形状，但观察到了对可靠性的负面影响。很明显，互连线的磨损与存在于互连线中的铜量密切相关。(C)2013爱思唯尔有限公司。保留所有权利。
The pursuit for reliable, deformable electronic systems took two major paths, utilizing either conductive elastomers or metal conductors. In the case of the latter, a mechanical robustness trade-off is made in return for metallic conductor native low resistivity allowing for realization of power demanding and large area applications as well (e.g. conformable lighting and signage). The mechanical trade-off stems from the metal conductor intrinsic inability for significant elongation without failure. One of many present attempts at enabling a metal conductor to perform in an elastomeric medium without failure is the SMI (Stretchable Molded Interconnect), a PCB compatible technology developed at the CMST. Its concept relies on an in-plane, meandered, metal track embedded into a soft, elastomeric material. This work focuses at cyclic, uniaxial elongation endurance and reliability assessment (Weibull analysis) of such interconnect in its most simple form - utilizing unsupported, meandered copper tracks embedded in PDMS (Polydimethylsiloxane). The tracks are evaluated as short interconnects (a few meander wavelengths long) terminating between flexible (non-stretchable) regions to incorporate the effect of flex-stretch transition mechanics on reliability. This is an important assessment for optimizing the interconnect geometry for practical applications where flex-stretch transitions will be inevitable, and reliability under repeated deformation is of interest (e.g. stretchable circuits for integration in textile). An attempt is made to reinforce the meander geometry by tapering the transitions, but a negative impact on reliability is observed. It is clearly demonstrated that the wearout of the interconnect is strongly related to the amount of copper present in the interconnect. (c) 2013 Elsevier Ltd. All rights reserved.