Optical dielectric constants of single crystalline silver films in the long wavelength range
Optical dielectric constants of single crystalline silver films in the long wavelength range
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DOI：
10.1364/ome.385723
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发表时间：
2020-02-01
影响因子：
2.8
通讯作者：
Li, Xiaoqin
中科院分区：
文献类型：
--
作者：
Choi, Junho;Cheng, Fei;Li, Xiaoqin
光学介电常数对于材料的电子和光学性质的建模至关重要。银作为一种低损耗的贵金属，得到了广泛的研究。最近开发的单晶Ag在电介质衬底上的外延生长促使人们努力表征其固有的光学介电功能。在本文中，我们报告的椭圆偏振光谱测量和分析厚，外延生长，单晶银膜。我们专注于0.18 - 1.0 eV或1.24 - 7 μ m的范围内，能量和波长范围，以前没有被检查使用外延膜。我们比较提取的介电常数和预测的光学性能与以前的测量。损耗明显低于广泛引用的Palik光学常数（即，在红外频率范围内高达2倍）。高质量外延Ag膜的基本光学性质的改进知识将在长波长范围内基于Ag的模拟和实际应用中产生广泛的影响。(C)根据OSA开放获取出版协议的条款，2020年美国光学学会
Optical dielectric constants are critical to modeling the electronic and optical properties of materials. Silver, as a noble metal with low loss, has been extensively investigated. The recently developed epitaxial growths of single crystalline Ag on dielectric substrates have prompted efforts to characterize their intrinsic optical dielectric function. In this paper, we report spectral ellipsometry measurements and analysis of a thick, epitaxially-grown, single-crystalline Ag film. We focus on the range of 0.18 - 1.0 eV or 1.24 - 7 mu m, an energy and wavelength range that has not been examined previously using epitaxial films. We compare the extracted dielectric constants and the predicted optical performances with previous measurements. The loss is appreciably lower than the widely quoted Palik's optical constants (i.e., up to a factor of 2) in the infrared frequency range. The improved knowledge of fundamental optical properties of the high-quality epitaxial Ag film will have a broad impact on simulations and practical applications based on Ag in the long wavelength range. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement