Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
复制标题
从单次衍射 X 射线的角度相关性表征单个 Xe 纳米粒子的晶体缺陷
DOI：
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发表时间：
2019
期刊：
影响因子：
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通讯作者：
Akinobu Niozu
中科院分区：
文献类型：
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作者：
Niozu Akinobu;Yokono Naomichi;Nishiyama Toshiyuki;Fukuzawa Hironobu;Sakurazawa Tomohiro;Matsuda Kazuhiro;Takanashi Tsukasa;You Daehyun;Li Yiwen;Ono Taishi;Gaumnitz Thomas;Schoeffler Markus;Grundmann Sven;Wada Shin-ichi;Carpeggiani Paolo;Xu Wei Qing;Liu Xi;仁王頭明伸;Akinobu Niozu;仁王頭明伸;仁王頭明伸;Akinobu Niozu
