Reliability and Portability Assessment Tool Based on Hazard Rates for an Embedded Open Source Software

Reliability and Portability Assessment Tool Based on Hazard Rates for an Embedded Open Source Software
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DOI：
10.4304/jsw.9.10.2546-2556
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发表时间：
2014-01
期刊：
J. Softw.
影响因子：
--
通讯作者：
Y. Tamura;S. Yamada
Y. Tamura;S. Yamada
中科院分区：
其他
文献类型：
--
作者：
Y. Tamura;S. Yamada

文献摘要

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被称为OSS之一的嵌入式OSS（开放源代码软件）在嵌入式系统领域已经获得了很多关注，即，Android、BusyBox、TRON等，但质量问题处理和客户支持的不佳阻碍了嵌入式OSS的发展。因此，许多公司一直犹豫不决，以创新的嵌入式OSS，因为OSS包括几个软件版本。此外，在单板计算机上安装嵌入式OSS的情况下，开发人员很难评估移植阶段的可靠性和可移植性。本文提出了一种基于风险率模型的嵌入式OSS软件可靠性/可移植性评估方法。特别是，我们分析了实际的软件故障发生的时间间隔数据显示的嵌入式OSS的软件可靠性/可移植性评估的数值例子。此外，我们还表明我们的模型和工具可以帮助提高嵌入式OSS系统开发的质量。
An embedded OSS (Open Source Software) known as one of OSS has been gaining a lot of attention in the embedded system area, i.e., Android, BusyBox, TRON, etc. However, the poor handling of quality problem and customer support prohibit the progress of embedded OSS. Therefore, many companies have been hesitant to innovate the embedded OSS because of OSS includes several software versions. Also, it is difficult for developers to assess reliability and portability of the porting-phase in case of installing the embedded OSS on a single-board computer. In this paper, we develop a method of software reliability/portability assessment tool based on a hazard rate model for the embedded OSS. Especially, we analyze actual software failure-occurrence time-interval data to show numerical examples of software reliability/portability assessment for the embedded OSS. Moreover, we show that our model and tool can assist quality improvement for embedded OSS systems development.