Attempt of quantitative analysis of morphological synaptic connectivity by combining focused ion beam milling and scanning electron microscopy (FIB-SEM) and confocal laser-scanning microscope
Attempt of quantitative analysis of morphological synaptic connectivity by combining focused ion beam milling and scanning electron microscopy (FIB-SEM) and confocal laser-scanning microscope
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尝试结合聚焦离子束铣削和扫描电子显微镜（FIB-SEM）以及共焦激光扫描显微镜对形态突触连接进行定量分析
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
Kaneko T
中科院分区：
文献类型：
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作者：
Sonomura T;Furuta T;Unzai T;Matsuda W;Iwai H;Fujiyama F;Uemura M;Kaneko T
