Boosting Cu─In─Zn─S-based Quantum-Dot Light-Emitting Diodes Enabled by Engineering Cu─NiOx /PEDOT:PSS Bilayered Hole-Injection Layer.

Boosting Cu─In─Zn─S-based Quantum-Dot Light-Emitting Diodes Enabled by Engineering Cu─NiOx /PEDOT:PSS Bilayered Hole-Injection Layer.
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DOI:
10.1002/smll.202307115
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发表时间:
2023-12
期刊:
影响因子:
13.3
通讯作者:
Jinxing Zhao;Fei Chen;Haoran Jia;Li-jin Wang;Ping Liu;Tao Luo;Li Guan;Xu Li;Zhe Yin
Jinxing Zhao;Fei Chen;Haoran Jia;Li-jin Wang;Ping Liu;Tao Luo;Li Guan;Xu Li;Zhe Yin
中科院分区:
材料科学1区
文献类型:
--
作者:
Jinxing Zhao;Fei Chen;Haoran Jia;Li-jin Wang;Ping Liu;Tao Luo;Li Guan;Xu Li;Zhe Yin

文献摘要

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The imbalance of charge injection is considered to be a major factor that limits the device performance of cadmium-free quantum-dot light-emitting diodes (QLEDs). In this work, high-performance cadmium-free Cu─In─Zn─S(CIZS)-based QLEDs are designed and fabricated through tailoring interfacial energy level alignment and improving the balance of charge injection. This is achieved by introducing a bilayered hole-injection layer (HIL) of Cu-doped NiOx (Cu─NiOx )/Poly(3,4-ethylenedioxythiophene): poly (styrene sulfonate) (PEDOT:PSS). High-quality Cu─NiOx film is prepared through a novel and straightforward sol-gel procedure. Multiple experimental characterizations and theoretical calculations show that the incorporation of Cu2+ ions can regulate the energy level structure of NiOx and enhance the hole mobility. The state-of-art CIZS-based QLEDs with Cu─NiOx /PEDOT:PSS bilayered HIL exhibit the maximum external quantum efficiency of 6.04% and half-life time of 48 min, which is 1.3 times and four times of the device with only PEDOT:PSS HIL. The work provides a new pathway for developing high-performance cadmium-free QLEDs.