Atomic Lifetime Measurements with Ion Traps of Many Sizes
Atomic Lifetime Measurements with Ion Traps of Many Sizes
复制标题
使用多种尺寸的离子阱进行原子寿命测量
DOI：
10.1238/physica.regular.061a00257
复制
发表时间：
2000
期刊：
影响因子：
2.9
通讯作者：
E. Träbert
中科院分区：
文献类型：
--
作者：
E. Träbert
原子寿命测量产生原子波函数的信息，补充了原子能级的数据，但对径向波函数的细节更敏感。相互组合（自旋变化）和电偶极禁戒跃迁的跃迁速率也对等离子体诊断和天体物理学中的应用感兴趣。在射频、静电和潘宁离子阱中的低电荷态离子的早期寿命测量最近得到了补充，在某些情况下被电子束离子阱（EBIT）和重离子储存环的实验所取代。在10 µs到500 ms范围内的寿命测量中，有几个测量的不确定度超过0.5%，挑战了理论。离子阱实验的典型特征，性能问题和技术的发展进行了审查，并可能的路线，进一步的进展进行了概述。
Atomic lifetime measurements yield information on atomic wavefunctions that supplements the data from atomic energy levels, but is more sensitive to details of the radial wavefunctions. Transition rates of intercombination (spin-changing) and electric-dipole forbidden transitions are of interest also for applications in plasma diagnostics and astrophysics. Earlier lifetime measurements of low-charge state ions in radiofrequency, electrostatic and Penning ion traps have recently been supplemented and in some cases superseded by experiments on electron-beam ion traps (EBIT) and heavy-ion storage rings. Several of these measurements of lifetimes in the range from 10 µs to 500 ms have reached uncertainties of better than 0.5% and challenge theory. Typical features of ion trap experiments, performance problems and technical developments are reviewed, and likely routes of further progress are outlined.