A Universal Pick-and-Place Assembly for Nanowires.
A Universal Pick-and-Place Assembly for Nanowires.
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DOI：
10.1002/smll.202201968
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发表时间：
2022-08
期刊：
影响因子：
13.3
通讯作者：
U. E. Ali;He Yang;V. Khayrudinov;Gaurav Modi;Zengguang Cheng;R. Agarwal;H. Lipsanen;H. Bhaskaran
中科院分区：
文献类型：
--
作者：
U. E. Ali;He Yang;V. Khayrudinov;Gaurav Modi;Zengguang Cheng;R. Agarwal;H. Lipsanen;H. Bhaskaran
随着奇异材料生长高功能纳米线技术的引入以及其在新应用中潜力的展示，在功能平台上沉积纳米线的技术已成为人们积极关注的领域。然而，迄今为止，以高精度和可靠性处理单个纳米线的困难一直是大规模集成高质量纳米线的限制因素。在这里，一种技术被证明可以在环境条件下在几乎任何平台上可靠地传输单纳米线。 InP、AlGaAs 和 GeTe 的功能纳米线可转移到电极、纳米光子器件、甚至超薄透射电子显微镜 (TEM) 膜等各种图案结构上。结果表明，该技术的多功能性进一步使得首次能够通过倏逝场耦合对 InP 纳米线进行片上纳米光机械测量。因此，该技术有助于将单纳米线轻松集成到以前被视为繁琐甚至不切实际的应用中，涵盖从 TEM 研究到原位电气、光学和机械表征的广泛范围。
With the introduction of techniques to grow highly functional nanowires of exotic materials and demonstrations of their potential in new applications, techniques for depositing nanowires on functional platforms have been an area of active interest. However, difficulties in handling individual nanowires with high accuracy and reliability have so far been a limiting factor in large-scale integration of high-quality nanowires. Here, a technique is demonstrated to transfer single nanowires reliably on virtually any platform, under ambient conditions. Functional nanowires of InP, AlGaAs, and GeTe on various patterned structures such as electrodes, nanophotonic devices, and even ultrathin transmission electron microscopy (TEM) membranes are transferred. It is shown that the versatility of this technique further enables to perform on-chip nano-optomechanical measurements of an InP nanowire for the first time via evanescent field coupling. Thus, this technique facilitates effortless integration of single nanowires into applications that were previously seen as cumbersome or even impractical, spanning a wide range from TEM studies to in situ electrical, optical, and mechanical characterization.