Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors
Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors
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DOI：
10.1364/oe.25.008739
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发表时间：
2017-04-17
期刊：
影响因子：
3.8
通讯作者：
Pernice, Wolfram
中科院分区：
文献类型：
--
作者：
Ferrari, Simone;Kovalyuk, Vadim;Pernice, Wolfram
我们研究偏置电流如何影响氮化铌中的热点弛豫动力学。为此，我们在双光子状态下驱动的波导集成超导纳米线单光子探测器上使用近红外泵浦探针技术。我们观察到较高偏置电流的皮秒弛豫时间显着增加。当在 1.7 K 浴温下施加开关电流 50% 的偏置电流时，可获得 (22 +/- 1) ps 的最小弛豫时间。我们还提出了一种实用的方法，基于不同偏置电流和不同照明条件下测量的探测器断层扫描的重建来准确估计光子检测机制。 (C) 2017年美国光学学会
We investigate how the bias current affects the hot-spot relaxation dynamics in niobium nitride. We use for this purpose a near-infrared pump-probe technique on a waveguide-integrated superconducting nanowire single-photon detector driven in the twophoton regime. We observe a strong increase in the picosecond relaxation time for higher bias currents. A minimum relaxation time of (22 +/- 1) ps is obtained when applying a bias current of 50% of the switching current at 1.7 K bath temperature. We also propose a practical approach to accurately estimate the photon detection regimes based on the reconstruction of the measured detector tomography at different bias currents and for different illumination conditions. (C) 2017 Optical Society of America