Fabrication and Stability Characterisation of Thin Film Transitors Based on Indium Zinc Oxide Deposited at Low Temperature

Fabrication and Stability Characterisation of Thin Film Transitors Based on Indium Zinc Oxide Deposited at Low Temperature
复制标题

低温沉积氧化铟锌薄膜晶体管的制备及稳定性表征

DOI:
--
复制
发表时间:
--
期刊:
E-MRS 2009 SPRING MEETING
影响因子:
--
通讯作者:
Andrew Flewitt (Author)
Andrew Flewitt (Author)
中科院分区:
--
文献类型:
--
作者:
Andrew Flewitt (Author)

文献摘要

相似文献