Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution
Core-energy level difference in the surface and bulk regions of organic semiconductor films studied by X-ray photoemission spectroscopy with depth resolution
复制标题
具有深度分辨率的X射线光电子能谱研究有机半导体薄膜表面和本体区域的核心能级差异
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
Naoki Sato
中科院分区：
文献类型：
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作者：
Hiroyuki Yoshida;Eisuke Ito;Masahiko Hara;Naoki Sato
