Phase‐shifting electron holography by beam tilting
Phase‐shifting electron holography by beam tilting
复制标题
通过光束倾斜进行相移电子全息术
DOI：
10.1063/1.106019
复制
发表时间：
1991
影响因子：
4
通讯作者：
A. Tonomura
中科院分区：
文献类型：
--
作者：
Q. Ru;T. Tanji;A. Tonomura
提出了一种在电子全息显微镜中不引入大量载流子条纹，直接测量样品的振幅和相位分布的相移法。通过用数字电压/电流源倾斜入射电子束来移位电子全息图的初始相位。用数字方法记录了具有不同相移的样品的几幅全息图，并用它们计算了样品的振幅和相位分布。给出了观察立方氧化镁晶体相分布的实验结果。
A phase‐shifting method to directly measure the amplitude and phase distribution of specimen in an electron holographic microscope without the introduction of large number of carrier fringes is proposed. The initial phase of electron holograms is shifted by tilting the incident electron beam with a digital voltage/current supply. Several holograms of a specimen with properly different phase shifts are recorded digitally and used to calculate the amplitude and phase distributions of the specimen. Experimental result of observing the phase distribution of a cubic MgO crystal is shown.