Autonomous image background removal for accurate and efficient close-range photogrammetry
Autonomous image background removal for accurate and efficient close-range photogrammetry
复制标题
DOI：
10.1088/1361-6501/aca497
复制
发表时间：
2022-11
影响因子：
2.4
通讯作者：
J. Eastwood;Richard Leach;S. Piano
中科院分区：
文献类型：
--
作者：
J. Eastwood;Richard Leach;S. Piano
近景摄影测量可用于重建具有非常高表面覆盖率的物体的密集点云，使其可用于制造计量任务，例如零件检查和验证。然而，与竞争技术相比，数据处理时间可能很慢。在本文中，我们提出了一种方法来自主地去除背景的图像内的摄影测量数据集。我们表明，直接在重建中使用掩码图像可以大大降低数据处理时间，降低内存利用率。此外，我们表明，物体表面上的点密度增加，而多余的背景点的数量减少。最后，将一组重建结果与一组触觉坐标测量结果进行比较。去除背景的重建显示点到网格距离的标准差比不去除背景的重建低30 µm。标准偏差的这种改进可能是由于相对于旋转台上的对象的静态背景，当在该背景数据上检测和匹配点时，导致三角测量误差。所提出的方法被证明是强大的几个例子文物，因此，可以实施，以提高测量效率和测量结果的摄影测量坐标测量系统。
Close-range photogrammetry can be used to reconstruct dense point clouds of an object with very high surface coverage, making it useful for manufacturing metrology tasks such as part inspection and validation. However, compared to competing techniques, data processing times can be slow. In this paper we present a method to autonomously remove the background from the images within a photogrammetric dataset. We show that using masked images directly in the reconstruction results in much lower data processing times, with lower memory utilisation. Furthermore, we show that the point density on the object surface is increased while the number of superfluous background points is reduced. Finally, a set of reconstruction results are compared to a set of tactile coordinate measurements. Reconstructions with the background removed are shown to have a standard deviation in the point to mesh distance of up to 30 µm lower than if the background is not removed. This improvement in standard deviation is likely due to the static background, relative to the object on the rotation stage, causing triangulation errors when points are detected and matched on this background data. The proposed approach is shown to be robust over several example artefacts and can, therefore, be implemented to improve the measurement efficiency and measurement results of photogrammetry coordinate measurement systems.