High-speed atomic force microscopy in slow motion—understanding cantilever behaviour at high scan velocities
High-speed atomic force microscopy in slow motion—understanding cantilever behaviour at high scan velocities
复制标题
慢动作中的高速原子力显微镜——了解高扫描速度下的悬臂行为
作者：
O. Payton;Loren M Picco;D. Robert;A. Raman;M. Homer;A. Champneys;M. Miles
使用扫描激光多普勒测振仪，我们已经确定了接触模式的高速原子力显微镜图像的噪声源和悬臂梁动力学，造成他们。通过分析重建动画的整个悬臂通过各种表面，我们确定了较高的本征模振荡沿着悬臂的图像伪影的原因。我们证明，这些可以通过监测位移，而不是悬臂的尖端偏转。我们比较偏转和位移检测方法，同时成像的校准网格在高速和使用位移成像的显着优势。
Using scanning laser Doppler vibrometer we have identified sources of noise in contact mode high-speed atomic force microscope images and the cantilever dynamics that cause them. By analysing reconstructed animations of the entire cantilever passing over various surfaces, we identified higher eigenmode oscillations along the cantilever as the cause of the image artefacts. We demonstrate that these can be removed by monitoring the displacement rather than deflection of the tip of the cantilever. We compare deflection and displacement detection methods whilst imaging a calibration grid at high speed and show the significant advantage of imaging using displacement.