EXAFS measurements for liquid Ge-Si alloys.
EXAFS measurements for liquid Ge-Si alloys.
复制标题
液态 Ge-Si 合金的 EXAFS 测量。
DOI：
10.1107/s0909049500016058
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发表时间：
2001
影响因子：
2.5
通讯作者：
K. Tamura
中科院分区：
文献类型：
--
作者：
M. Inui;T. Matsusaka;D. Ishikawa;Y. Sakaguchi;X. Hong;M. H. Kazi;K. Tamura
首次对液态Ge-Si合金进行了Ge-K边的EXAFS测量，研究了Ge原子周围的局域结构。为了对高温液态合金进行EXAFS测量，研制了一种新的蓝宝石吸收池。对Si含量为10%~ 60%的液态合金和Si含量为10%~ 70%的晶态合金进行了测量。EXAFS振荡，x（k），甚至在1480 ℃下观察到液态Ge（0.4）Si（0.6）。对于液态和晶态合金，随着Si浓度的增加，由x（k）的傅里叶变换得到的径向分布函数中第一个峰的位置向更小的距离移动。谐波近似下的曲线拟合分析结果表明，液态合金中的Ge-Ge键和Ge-Si键随Si含量的增加而变长，而晶态合金中的Ge-Ge键和Ge-Si键则稍短。
EXAFS measurements around the Ge-K edge have been carried out for liquid Ge-Si alloys for the first time to investigate the local structure around a Ge atom. To perform the EXAFS measurements for the liquid alloys with high melting temperatures, a new sapphire cell have been developed. The measurements were carried out for the liquid alloys from 10% to 60% of Si and the crystalline ones from 10% to 70% of Si as a reference. EXAFS oscillations, x(k), are observed even at 1480 degrees C for liquid Ge(0.4)Si(0.6). The position of the first peak in the radial distribution function obtained from Fourier transform of x(k) is shifted towards smaller distance for liquid and crystalline alloys with increasing Si concentration. The results of a curve-fit analysis in a harmonic approximation show that Ge-Ge and Ge-Si bonds in the liquid alloys become long with increasing Si concentration while those become slightly short in the crystaline ones.