Interference colors of thin oxide layers on titanium
Interference colors of thin oxide layers on titanium
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DOI：
10.1002/col.20403
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发表时间：
2008-06-01
影响因子：
1.4
通讯作者：
Pedeferri, MariaPia
中科院分区：
文献类型：
--
作者：
Diamanti, Maria V.;Del Curto, Barbara;Pedeferri, MariaPia
这项工作涉及通过阳极氧化获得的不同氧化钛薄膜的颜色特性的表征。这些氧化物的颜色随薄膜厚度的变化而变化，因为这是由于金属-氧化物-空气界面处发生的光干涉现象造成的。使用分光光度技术进行颜色测量：获得的值属于比色空间CIELAB，其被定义为标准比色空间。这些分析的结果与氧化物结构相关，通过 X 射线衍射技术进行分析，确定氧化物结构是非晶态或半晶态。还考虑了氧化物厚度。这一特征是从椭圆测量数据和反射光谱中得出的：这两个数据显示出良好的一致性。对商业纯钛（ASTM 2 级）和钛合金 Ti-6Al-4V 基材进行了研究。 (C) 2008 年 Wiley 期刊公司。
This work deals with the characterization of the color properties of different titanium oxide films, obtained by means of anodic oxidation. The color of these oxides varies with film thickness, since it is due to light interference phenomena taking place at the metal-oxide-air interfaces. Color measurements were carried out by using spectrophotometry techniques: the values obtained belong to the colorimetric space CIELAB, which is defined as standard colorimetric space. The results of these analyses were related to the oxide structure, analyzed with X-ray diffraction techniques, which was determined to be either amorphous or semicrystalline. Also the oxide thickness was taken into account. This feature was derived both from ellipsometric data and from reflectance spectra: the two data are shown to be in good adherence. Both commercial purity titanium (grade 2 ASTM) and titanium alloy Ti-6Al-4V substrates were investigated. (C) 2008 Wiley Periodicals, Inc.