X-ray diffraction tomography employing an annular beam
X-ray diffraction tomography employing an annular beam
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DOI：
10.1364/oe.22.011930
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发表时间：
2014-05-19
期刊：
影响因子：
3.8
通讯作者：
Prokopiou, Danae
中科院分区：
文献类型：
--
作者：
Evans, Paul;Rogers, Keith;Prokopiou, Danae
我们通过环形 X 射线束扫描样品来演示深度分辨材料表征。我们使用位于环形光束定义的圆形暗场中心的平面探测器测量样品的布拉格 X 射线衍射。衍射最大值通过沿该光束的晶相位置进行光学编码。通过断层合成恢复深度分辨材料相图像。我们使用包含三个不同相的异构三维对象来演示我们的技术；环四亚甲基四硝胺、铜和镍，分布在低密度介质中。我们的技术在分析成像中具有广泛的适用性，并且在扫描尺寸和 X 射线能量方面均可扩展。 (C)2014年美国光学学会
We demonstrate depth-resolved materials characterization by scanning a sample through an annular beam of X-rays. We measure Bragg X-ray diffraction from a sample with a planar detector positioned centrally in a circular dark field defined by the annular beam. The diffraction maxima are optically encoded with the position of crystalline phases along this beam. Depth-resolved material phase images are recovered via tomosynthesis. We demonstrate our technique using a heterogeneous three-dimensional object comprising three different phases; cyclotetramethylene tetranitramine, copper and nickel, distributed in a low density medium. Our technique has wide applicability in analytical imaging and is scalable with respect to both scan size and X-ray energy. (C)2014 Optical Society of America