Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy
Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy
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DOI：
10.1046/j.1365-2818.2000.00710.x
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发表时间：
2000-05-01
影响因子：
2
通讯作者：
Gustafsson, MGL
中科院分区：
文献类型：
--
作者：
Gustafsson, MGL
横向分辨率超过经典的衍射极限的两个因素是通过使用空间结构照明在宽视场荧光显微镜。用一系列激发光图案照射样品，这使得通常无法访问的高分辨率信息被编码到观察到的图像中。对记录的图像进行线性处理，以提取新的信息，并产生具有两倍于正常分辨率的重建。与共焦显微镜不同，分辨率的提高是在不需要丢弃任何发射光的情况下实现的。该方法产生的图像显着增加清晰度相比，传统和共焦显微镜。
Lateral resolution that exceeds the classical diffraction limit by a factor of two is achieved by using spatially structured illumination in a wide-field fluorescence microscope. The sample is illuminated with a series of excitation light patterns, which cause normally inaccessible high-resolution information to be encoded into the observed image. The recorded images are linearly processed to extract the new information and produce a reconstruction with twice the normal resolution. Unlike confocal microscopy, the resolution improvement is achieved with no need to discard any of the emission light. The method produces images of strikingly increased clarity compared to both conventional and confocal microscopes.