Analysis of Safety-Critical Computer Failures in Medical Devices
Analysis of Safety-Critical Computer Failures in Medical Devices
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DOI:
10.1109/msp.2013.49
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发表时间:
2013-07-01
影响因子:
1.9
通讯作者:
Raman, Jai
中科院分区:
文献类型:
--
作者:
Alemzadeh, Homa;Iyer, Ravishankar K.;Raman, Jai
Malfunctioning medical devices are one of the leading causes of serious injury and death in the US. Analysis of human-written descriptions of recalls and adverse event reports reveals safety issues in these devices and provides insights on the future challenges in the design of safety-critical devices.