Signal-Amplified Analysis of Molecular Layers Made by Bipolar Electrochemistry
Signal-Amplified Analysis of Molecular Layers Made by Bipolar Electrochemistry
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双极电化学分子层的信号放大分析
DOI：
10.1002/celc.201500350
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发表时间：
2016
期刊：
影响因子：
4
通讯作者：
Shinsuke Inagi
中科院分区：
文献类型：
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作者：
Naoki Shida;Fusao Kitamura;Toshio Fuchigami;Ikuyoshi Tomita;Shinsuke Inagi
在这篇文章中，我们研究了氧化铟锡（ITO）板作为双极电极（BPE）的表面改性，通过双极电解与芳基重氮盐的良好电化学。为了详细研究芳基分子层的形成行为，我们采用了两种不同的方法，即直接分析层和基于表面引发聚合（SIP）技术的信号放大思想的间接分析。对于直接分析，我们对分子层进行了X射线光电子能谱（XPS）测量，发现引入的芳基的量以梯度方式存在，反映了BPE上产生的电势斜率。在SIP过程之后，通过红外反射吸收光谱（IR-RAS）和使用针式测试仪的膜厚度测量可以检测到接枝聚合物放大的信号。还进行了聚合物刷的表面的原子力显微镜（AFM）测量。这些间接的方法提供了详细的信息，通过双极电解过程中制备的原始分子层的改性行为。
In this article, we investigate the surface modification of an indium tin oxide (ITO) plate as a bipolar electrode (BPE) by bipolar electrolysis with the well‐established electrochemistry of aryl diazonium salts. To study in detail the formation behavior of a molecular layer of the aryl groups, we employ two different approaches, namely, the direct analysis of the layer and the indirect analysis based on the idea of signal amplification by the surface‐initiated polymerization (SIP) technique. For the direct analysis, we made X‐ray photoelectron spectroscopy (XPS) measurements of the molecular layer and find that the amount of the aryl group introduced is in a gradient manner, reflecting the potential slope generated on the BPE. After the SIP process, signals amplified by the grafting polymers can be detected by infrared reflection absorption spectroscopy (IR–RAS) and film thickness measurement with a stylus‐type tester. Atomic force microscopy (AFM) measurement of the surface of the polymer brush was also carried out. These indirect methods afford detailed information on the modification behavior of the original molecular layer prepared through the bipolar electrolysis process.