Application of in situ surface scraping for extracting bulk component of XPS signal – example of LiNbO3 and GaSb
Application of in situ surface scraping for extracting bulk component of XPS signal – example of LiNbO3 and GaSb
复制标题
应用原位表面刮削提取 XPS 信号的大量成分 - LiNbO3 和 GaSb 示例
DOI：
10.1016/s0925-8388(98)01000-7
复制
发表时间：
1999
影响因子：
6.2
通讯作者：
J. Sobczak
中科院分区：
文献类型：
--
作者：
R. Iwanowski;M. Heinonen;I. Pracka;J. Raczyńska;K. Fronc;J. Sobczak
报道了有关原位刮削过程对 LiNbO3 和 GaSb 的 XPS 核心能级光谱影响的实验证据。事实证明，这种表面处理方法对于提取从晶体获取的 XPS 信号的大部分成分非常高效。特别强调了原位刮削相对于 Ar+离子轰击表面清洁的两个具体优点。首先，完全去除表面吸附物质（碳和氧）和表面氧化物。其次，尽管晶体表面存在机械损伤，但原位刮削不会引入可能影响所研究化合物（尤其是 LiNbO3）的体 XPS 核心能谱的表面缺陷。这里报道的 GaSb 的批量 XPS 数据仍然是使用这种制备方法获得的第一个参考数据。
Experimental evidence concerning an influence of the in situ scraping process on the XPS core-level spectra of LiNbO3and GaSb is reported. It proved high efficiency of this surface preparation method for extracting a bulk component of the XPS signal acquired from a crystal. In particular, two specific advantages of in situ scraping over a surface cleaning by Ar+ion bombardment have been underlined. Firstly, complete removal of surface adsorbed species (carbon and oxygen) and of the surface oxides. Secondly, despite mechanical damage of the crystal surface, the in situ scraping does not introduce surface defects that could influence the bulk XPS core-level spectra of the compounds studied (especially LiNbO3). The bulk XPS data for GaSb, reported here, remain the first reference ones obtained with the use of this preparation method.