Sampling biased lattice configurations using exponential metrics
Sampling biased lattice configurations using exponential metrics
复制标题
使用指数度量对有偏差的晶格配置进行采样
DOI：
10.1137/1.9781611973068.9
复制
发表时间：
2009
影响因子：
1.3
通讯作者：
Dana Randall
中科院分区：
文献类型：
--
作者：
Sam Greenberg;A. Streib;Dana Randall
Monotonic surfaces spanning finite regions of Zd arise in many contexts, including DNA-based self-assembly, card-shuffling and lozenge tilings. We explore how we can sample these surfaces when the distribution is biased to favor higher surfaces. We show that a natural local chain is rapidly mixing with any bias for regions in Z2, and for bias λ > d2 in Zd, when d > 2. Moreover, our bounds on the mixing time are optimal on d-dimensional hyper-cubic regions. The proof uses a geometric distance function and introduces a variant of path coupling in order to handle distances that are exponentially large.
影响因子：
2.9
作者：
FU, TJ;SEEMAN, NC
通讯作者：
SEEMAN, NC