Single-atom dynamics in scanning transmission electron microscopy
Single-atom dynamics in scanning transmission electron microscopy
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DOI：
10.1557/mrs.2017.187
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发表时间：
2017-09-01
期刊：
影响因子：
5
通讯作者：
Pennycook, Stephen J.
中科院分区：
文献类型：
--
作者：
Mishra, Rohan;Ishikawa, Ryo;Pennycook, Stephen J.
扫描透射电子显微镜（STEM）的像差校正同时提高了空间和时间分辨率，使捕获材料内部单个原子的动力学成为可能，并对材料的动态行为产生新的见解。在这篇文章中，我们描述了通过传递能量和动量导致原子激发的不同的光束-物质相互作用。我们回顾了最近的连续STEM成像的例子，以证明单原子在材料内、位错处、晶粒和界面边界处以及表面上的动态行为。我们还讨论了这种动态行为对材料性能的影响。最后，我们总结了正在进行的仪器和算法开发，我们预计这些开发将显著提高时间分辨率，从而前所未有地深入了解原子尺度上材料的动态行为。
The correction of aberrations in the scanning transmission electron microscope (STEM) has simultaneously improved both spatial and temporal resolution, making it possible to capture the dynamics of single atoms inside materials, and resulting in new insights into the dynamic behavior of materials. In this article, we describe the different beam-matter interactions that lead to atomic excitations by transferring energy and momentum. We review recent examples of sequential STEM imaging to demonstrate the dynamic behavior of single atoms both within materials, at dislocations, at grain and interface boundaries, and on surfaces. We also discuss the effects of such dynamic behavior on material properties. We end with a summary of ongoing instrumental and algorithm developments that we anticipate will improve the temporal resolution significantly, allowing unprecedented insights into the dynamic behavior of materials at the atomic scale.