A treatment of instrumental smearing effects in circularly symmetric small-angle scattering
A treatment of instrumental smearing effects in circularly symmetric small-angle scattering
复制标题
圆对称小角散射中仪器弥散效应的处理
DOI：
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发表时间：
1985
期刊：
影响因子：
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通讯作者：
V. Ramakrishnan
中科院分区：
文献类型：
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作者：
V. Ramakrishnan
仪器涂抹效应会导致测量的小角度散射数据与理想截面的显著偏差。描述了各种贡献对涂抹的影响。详细讨论了在圆孔准直仪上测量圆对称散射的情况。对于这样的测量，它显示了如何涂抹已知的散射函数，以便通过与观测数据的拟合来估计参数，以及如何使用间接傅立叶变换方法来涂抹观测到的散射强度。
Instrumental smearing effects can result in a significant deviation of measured small-angle scattering data from the ideal cross section. The effect of various contributions to smearing is described. The case of circularly symmetric scattering measured on an instrument collimated by circular apertures is treated in detail. For such measurements, it is shown how known scattering functions can be smeared to allow estimation of parameters by a fit to the observed data, and also how the indirect Fourier transformation method can be used to desmear the observed scattered intensity.