Latest applications of 3D ToF-SIMS bio-imaging
Latest applications of 3D ToF-SIMS bio-imaging
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DOI：
10.1116/1.4907727
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发表时间：
2015-03-01
期刊：
影响因子：
2.1
通讯作者：
Fletcher, John S.
中科院分区：
文献类型：
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作者：
Fletcher, John S.
飞行时间二次离子质谱仪(ToF-SIMS)是一种快速发展的用于表征多种材料的技术。最近，仪器和样品制备方法的进步为进行3D分子成像实验提供了能力。多原子离子束，如C-60，和气体团簇离子束，通常是Arn(n=500-4000)，大大减少了与原子束持续轰击有机样品有关的亚表面损伤积累。在这篇综述中，讨论了该技术的能力，并列举了用于模型膜系统、植物单细胞和组织样品分析的三维成像方法的例子。还讨论了3D ToF-SIMS成像的持续挑战，以及可能在不久的将来提供改进的3D成像前景的最新发展。(C)2015年作者(S)。
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a rapidly developing technique for the characterization of a wide range of materials. Recently, advances in instrumentation and sample preparation approaches have provided the ability to perform 3D molecular imaging experiments. Polyatomic ion beams, such as C-60, and gas cluster ion beams, often Arn (n = 500-4000), substantially reduce the subsurface damage accumulation associated with continued bombardment of organic samples with atomic beams. In this review, the capabilities of the technique are discussed and examples of the 3D imaging approach for the analysis of model membrane systems, plant single cell, and tissue samples are presented. Ongoing challenges for 3D ToF-SIMS imaging are also discussed along with recent developments that might offer improved 3D imaging prospects in the near future. (C) 2015 Author(s).