An Elliptical Elastic-Plastic Microcontact Model Developed for an Ellipsoid in Contact With a Smooth Rigid Flat
An Elliptical Elastic-Plastic Microcontact Model Developed for an Ellipsoid in Contact With a Smooth Rigid Flat
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DOI：
10.1115/1.2768077
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发表时间：
2007-10
影响因子：
2.5
通讯作者：
Li Lin;J. Lin
中科院分区：
文献类型：
--
作者：
Li Lin;J. Lin
本研究的主要目的是确定可变形椭球和刚性光滑平面微接触处产生的弹塑性变形状态。有限元分析以八分之一椭球体和平板为接触体，采用多尺寸单元网格划分方案。给出了关于接触压力和在接触区域形成的等效 von Mises 应力的两个观察到的现象，以便确定椭圆度为 k e 的椭球体完全塑性变形状态的开始。如果椭圆形接触区域的椭圆率(k)定义为短轴与长轴的长度比，则当干涉充分增加时，无论k e 值如何，它都渐近于k e 值。与弹塑性变形区域相关的无量纲干涉区域通过增加椭球的椭圆率（ke）而变窄。发现接触压力、接触面积和接触载荷等微接触参数的显着差异是干涉和椭球体 k e 参数的函数。如果 k e 值降低，则与弹塑性变形区域和全塑性变形区域的初始相对应的干扰都会增加。本模型预测的弹塑性变形状态开始时表现出的接触面积和接触载荷低于从 Horng 模型（Horng，J. H.，1998，“An Elliptical Elastic-Plastic Asperity Microcontact Model for Rough Surfaces”，ASME J. Tribol.，120，第 82-88 页）和 Jeng-Wang 模型（Jeng，Y. R.，and Wang，P. Y.，2003，“考虑弹性、弹塑性和塑性变形的椭圆形微接触模型，”ASME J. Tribol.，125，第 232-240 页）讨论了上述微接触模型的平均接触压力、接触面积和接触载荷结果的巨大差异，并从这些模型的发展和为边界条件设置的情况解释了这些差异。弹塑性变形状态。
The determination of the elastoplastic deformation regime arising at the microcontact of a deformable ellipsoid and a rigid smooth flat was the main purpose of this study. One-eighth of an ellipsoid and a flat plate were taken as the contact bodies in the finite element analysis, and a mesh scheme of multisize elements was applied. Two observed phenomena regarding the contact pressures and the equivalent von Mises stresses formed at the contact area are given in order to identify the inception of the fully plastic deformation regime of an ellipsoid with an ellipticity k e . If the ellipticity (k) of an elliptical contact area is defined as the length ratio of the minor axis to the major axis, it is asymptotic to the k e value when the interference is sufficiently increased, irrespective of the k e value. The dimensionless interference regime associated with the elastoplastic deformation regime is narrowed by increasing the ellipticity of the ellipsoid (k e Significant differences in the microcontact parameters such as the contact pressure, the contact area, and the contact load were found to be a function of the interference and the k e parameter of an ellipsoid. The interferences corresponding to the inceptions of the elastoplastic and fully plastic deformation regimes are both increased if the k e value is lowered. The interference, the contact area, and the contact load predicted by the present model for the behavior demonstrated at the inception of the elastoplastic deformation regime are lower than those obtained from the Horng model (Horng, J. H., 1998, "An Elliptical Elastic-Plastic Asperity Microcontact Model for Rough Surfaces, " ASME J. Tribol., 120, pp. 82-88) and the Jeng-Wang model (Jeng, Y. R., and Wang, P. Y., 2003, "An Elliptical Microcontact Model Considering Elastic, Elastoplastic, and Plastic Deformation, " ASME J. Tribol., 125, pp. 232-240). Big differences in the results of the average contact pressure, the contact area, and the contact load among the above microcontact models are discussed. The discrepancies are also explained from the developments of these models and boundary conditions set for the elastoplastic deformation regime.