Inclination of a threading dislocation in an epilayer of 4H-SiC
Inclination of a threading dislocation in an epilayer of 4H-SiC
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DOI:
10.7567/jjap.53.111302
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发表时间:
2014-11-01
影响因子:
1.5
通讯作者:
Onda, Shoichi
中科院分区:
文献类型:
--
作者:
Saka, Hiroyasu;Watanabe, Hiroki;Onda, Shoichi
Threading dislocations (TDs) are inclined from the [0001] c-axis in 4H-SiC epilayers which are produced by the step-controlled technique. The reason for this inclination is discussed in the framework of isotropic elastic theory of dislocation. The elastic strain energy of a TD in an epilayer is calculated as a function of its orientation, and the minimum energy orientation is used to predict the inclination angle. The results of the calculations are as follows. For a cut-off angle (alpha) of 4 degrees, a threading edge dislocation (TED) and a threading pure screw dislocation (TpSD) are inclined from the c-axis by 12 and 2 degrees, respectively: Threading near screw dislocations (TnSDs) and threading mixed dislocations (TMDs) are inclined by angles ranging from 8 to 15 degrees from the c-axis, depending on their actual Burgers vectors. Similarly for a of 8 degrees, a TED and a TpSD are inclined from the c-axis by 21 and 4 degrees, respectively: TnSDs and TMDs are inclined from the c-axis by angles ranging from 7 to 17 degrees. These predictions are in good agreement with experiment. (C) 2014 The Japan Society of Applied Physics