A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment
A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment
复制标题
一种用于基于广播扫描的测试压缩环境中全速扫描测试的新型后 ATPG IR 压降降低方案
DOI：
10.1145/1687399.1687420
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
(他7名)
中科院分区：
文献类型：
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作者：
Kohei Miyase;(他7名)
为了避免测试引起的成品率损失，在高速扫描测试期间减少测试周期中的IR降已成为强制性的。基于X-标识和X-填充的后ATPG测试修改是一种有效的方法，因为它不会引起电路/时钟设计的改变和测试向量计数的膨胀。然而，由于X比特的可用性有限，应用这种方法来测试压缩被认为具有挑战性。本文针对目前广泛使用的基于广播扫描的测试压缩环境，提出了一种新颖实用的压缩感知CA（Compression-Aware）测试修改方案，以降低IR压降。该方案的特点是：（1）CA电路重构，减少了对基于广播扫描的测试压缩进行测试修改的工作量;（2）CA X识别，增加了风险测试向量的X位;因此，CA测试修改方案可以实现显着的IR下降减少，即使在一个测试立方体只有少量的X位。通过工业电路创建的三种压缩配置的实验结果清楚地证明了这一优势。
Reducing IR-drop in the test cycle during at-speed scan testing has become mandatory for avoiding test-induced yield loss. An efficient approach for this purpose is post-ATPG test modification based onX-identification andX-filling since it causes no circuit/clock design change and no test vector count inflation. However, applying this approach to test compression has been considered challenging due to the limited availability ofX-bits. This paper solves this serious problem by proposing a novel and practicalCA(Compression-Aware) test modification scheme for reducing IR-drop in the widely-used broadcast-scan based test compression environment. This unique scheme features (1)CA circuit remodelingfor minimizing the effort of applying test modification to broadcast-scan-based test compression, (2)CA X-identificationfor increasingX-bits for risky test vectors, and (3)CA X-fillingfor effectively using limitedX-bits in reducing IR-drop. As a result, the CA test modification scheme can achieve significant IR-drop reduction even when a test cube only has a small number ofX-bits. This advantage is clearly demonstrated by experimental results on three compression configurations created from an industrial circuit.