Development and stress analysis of nano cutting force detector
Development and stress analysis of nano cutting force detector
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DOI:
10.2320/jinstmet.68.275
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发表时间:
2004-05-01
影响因子:
--
通讯作者:
Hoshino, Y
中科院分区:
文献类型:
--
作者:
Asakura, K;Hirohata, Y;Hoshino, Y
The authors have developed the nano cutting force detector (NCFD), and obtained the cutting characteristics of the epoxy resin, the rat kidney, and the platinum spatter film of 40 nm thick. There was no inferiority for the ultra thin sections made by NCFD when comparing with a ready-made ultramicrotome. Consequently, (1) it was possible to measure the cutting force in the nano level order sectioning. (2) The cutting force profile greatly depends on the shape of the surface. (3) The cutting force increases with increasing of the cutting speed. (4) The cutting force increases with the thickness at a constant speed. (5) The cutting force increases with the hardness in the range of HV1-25. (6) The 40 nn thick layer was detectable by using semiconductor strain gauge type sensor. Sectioning force profile of the NCFD reflected the chatter, the condition of the ultra-thin section, and the contact with knife and cutting surface. This new evaluation technology was established with NCFD.