Tamotsu Okamoto: "Characterization of the Interface between Ga_2Se_3 Epitaxial Layer and (100)GaP Substrate by Transmission Electron Microscopy" Proc.1st International Symposium on Control of Semiconductor Interfaces. (in press). (1993)
Tamotsu Okamoto: "Characterization of the Interface between Ga_2Se_3 Epitaxial Layer and (100)GaP Substrate by Transmission Electron Microscopy" Proc.1st International Symposium on Control of Semiconductor Interfaces. (in press). (1993)
复制标题
Tamotsu Okamoto：“通过透射电子显微镜表征 Ga_2Se_3 外延层和 (100)GaP 衬底之间的界面”Proc.1st 国际半导体界面控制研讨会。
DOI：
--
复制
发表时间：
--
期刊：
影响因子：
--
通讯作者：
中科院分区：
文献类型：
--
作者：
