Angle‐resolved photoemission spectroscopy of ultrathin films of H2‐phthalocyanine on MoS2 surfaces
Angle‐resolved photoemission spectroscopy of ultrathin films of H2‐phthalocyanine on MoS2 surfaces
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MoS2 表面 H2-酞菁超薄膜的角分辨光电子能谱
DOI：
10.1063/1.465433
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发表时间：
1993
影响因子：
4.4
通讯作者：
H. Inokuchi
中科院分区：
文献类型：
--
作者：
N. Ueno;Katsumi Suzuki;S. Hasegawa;K. Kamiya;K. Seki;H. Inokuchi
使用同步辐射测量了沉积在解理MoS 2表面上的H2-酞菁超薄膜的角分辨紫外光电子能谱。来自最高π带的光电子强度的起飞角（θ）依赖性在θ=34°处显示出尖锐的最大值。观察到的角分布可以通过使用独立原子中心近似结合分子轨道计算计算的分子平面取向的角分布来很好地解释。计算结果表明，该方法可以有效地描述复杂有机大分子薄膜和H2-酞菁分子在MoS 2表面的光电子角分布。
The angle‐resolved ultraviolet photoelectron spectra were measured for ultrathin films of H2–phthalocyanine deposited on cleaved MoS2 surfaces using synchrotron radiation. The take‐off angle (θ) dependence of photoelectron intensity from the highest π band showed a sharp maximum at θ=34°. The observed angular distribution could be explained excellently by an angular distribution calculated for flat‐lie orientation of the molecules using independent‐atomic‐center approximation combined with molecular orbital calculation. The results confirm that the calculation method is useful to describe photoelectron angular distribution from thin films of large and complex organic molecules and H2‐phthalocyanine molecules lie flatly on MoS2 surface.