Fine Probe for an STM-SQUID Probe Microscope
Fine Probe for an STM-SQUID Probe Microscope
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DOI：
10.1109/tasc.2012.2235506
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发表时间：
2013-06
影响因子：
1.8
通讯作者：
N. Watanabe;Y. Miyato;S. Matsusawa;M. Tachiki;T. Hayashi;H. Itozaki
中科院分区：
文献类型：
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作者：
N. Watanabe;Y. Miyato;S. Matsusawa;M. Tachiki;T. Hayashi;H. Itozaki
将高温超导SQUID探针显微镜与扫描隧道显微镜相结合，研制了一种扫描隧道显微镜SQUID探针显微镜。探针的制备是STM-SQUID显微镜发展的一个重要因素。因此，我们研究了探针的制备，以提高STM-SQUID显微镜的分辨率。探头材料为直径为90 μm的坡莫合金丝。我们通过电化学抛光使探针针尖变尖来制作探针。通过改变电化学抛光的电压，可以制作出各种形状的探针。探针针尖的锥角和针尖半径是探针制备中的重要参数。探针的尖端半径为约20 nm后，探针尖端是尖锐的电压为30 V。然后，我们测量的典型的磁性材料，如镍薄膜的STM-SQUID显微镜的磁性图像，将探针的尖端半径为20 nm。在镍薄膜的磁图像中清楚地观察到磁畴结构。
We developed a scanning tunneling microscopy (STM) SQUID probe microscope by the combination of the high-Tc SQUID probe microscope with an STM microscope. Preparation of a probe is an important factor for the development of the STM-SQUID microscope. Therefore, we studied the probe preparation in order to improve the resolution of the STM-SQUID microscope. The probe material is a permalloy wire of 90 μm in diameter. We fabricated the probes by sharpening the probe tip by electrochemical polishing. We can fabricate various shaped probe by changing the voltage applied to the electrochemical polishing. The conical angle of the probe tip and tip radius are the important parameters in probe preparation. The tip radius of the probe was about 20 nm after the probe tip was sharpened with a voltage of 30 V. We then measured magnetic images of typical magnetic materials such as a nickel thin film by the STM-SQUID microscope, incorporating the probe with a tip radius of 20 nm. A magnetic domain structure was clearly observed in the magnetic image of the nickel thin film.