High-Resolution Optical Line Width Measurements as a Material Characterization Tool
High-Resolution Optical Line Width Measurements as a Material Characterization Tool
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DOI：
10.1021/acs.jpcc.6b03337
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发表时间：
2016-06-30
影响因子：
3.7
通讯作者：
Goldner, Philippe
中科院分区：
文献类型：
--
作者：
Kunkel, Nathalie;Bartholomew, John;Goldner, Philippe
我们提出了一个Eu3+掺杂Y2O3透明陶瓷的案例研究，其中高分辨率激光光谱被用作材料表征工具。通过将相干和非相干光谱学的结果与其他表征方法进行比较，我们表明光学技术可以提供有关材料中激活离子局部环境的补充信息。因此，除了量子信息技术研究的材料之外，高分辨率光谱学可能对更广泛的稀土掺杂光学材料的研究有兴趣。用于研究稀土离子单晶中窄光学跃迁的光谱学的改进表明，这些技术是探测稀土离子局部环境的极其敏感的工具。这些技术，如光子回波实验，在开发用于量子信息技术和光谱滤波应用的材料方面非常重要。在这里，我们将这些技术应用于透明陶瓷样品，并将结果与传统材料表征技术获得的信息进行比较。我们目前的研究表明，激光光谱方法对微结构应变和缺陷的存在具有很高的灵敏度。特别是，灵敏度足以检测到在名义上等效的材料中不同热处理引起的微小变化。我们的工作结果表明，将高分辨率光学测量与缺陷和微结构应变联系起来是可能的。
We present a case study on Eu3+-doped Y2O3 transparent ceramics in which high-resolution laser spectroscopy is used as a material characterization tool. By comparing the results from coherent and incoherent optical spectroscopy with other characterization methods, we show that optical techniques can deliver supplementary information about the local environment of the activator ions in materials. Thus, high-resolution spectroscopy may be of interest for the investigation of a wider range of rare earth doped optical materials beyond materials studied for quantum information technology. The refinement of optical spectroscopy for the study of narrow optical transitions in rare earth ion single crystals has demonstrated that these techniques are extremely sensitive tools for probing the local environment of the rare earth ion. These techniques, such as photon echo experiments, have been important in developing materials for quantum information technology and spectral filtering applications. Here, we apply these techniques to transparent ceramic samples and compare the results with information gained from conventional material characterization techniques. Our present study demonstrates the high sensitivity of laser spectroscopic methods to microstructural strain and the presence of defects. In particular, the sensitivity is sufficient to detect small changes introduced by different thermal treatments in nominally equivalent materials. The results of our work show that it is possible to relate high resolution optical measurements to defects and microstructural strain.