Integrated-optic variable delay line and its application to a low-coherence reflectometer.
Integrated-optic variable delay line and its application to a low-coherence reflectometer.
复制标题
集成光学可变延迟线及其在低相干反射计中的应用。
DOI:
10.1364/ol.30.002739
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发表时间:
2005
期刊:
影响因子:
3.6
通讯作者:
H. Takahashi
中科院分区:
文献类型:
--
作者:
K. Takiguchi;M. Itoh;H. Takahashi
We propose a large-scale variable delay line based on planar light-wave circuit technology and its application as a reference arm in an optical low-coherence reflectometer. This variable delay line is composed of 16 asymmetrical delay arm pairs sandwiched between 2 optical switches, which select the path for a needed delay. This configuration enables us to eliminate the need for a moving part in the reflectometer. We can scan the reference arm over a length of 262.1 mm with a step of less than 1.0 microm in air and achieve reflectometer sensitivity of about -47 dB.