STATIC SECONDARY-ION MASS-SPECTROMETRY OF ADSORBED PROTEINS
STATIC SECONDARY-ION MASS-SPECTROMETRY OF ADSORBED PROTEINS
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DOI：
10.1021/ac00058a021
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发表时间：
1993-05-15
影响因子：
7.4
通讯作者：
MOULDER, JF
中科院分区：
文献类型：
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作者：
MANTUS, DS;RATNER, BD;MOULDER, JF
静态二次离子质谱（西姆斯）用于分析吸附到生物材料表面的蛋白质。通过检查16种氨基酸的均聚物建立了光谱解释协议。该方案允许分配各种氨基酸特有的峰。静态西姆斯用于分析吸附到钛的血浆蛋白。探索了影响光谱中观察到的相对强度的各种因素。通过分析污染的传感器膜，研究蛋白质污染的材料的技术的潜在应用。
Static secondary ion mass spectrometry (SIMS) was used to analyze proteins adsorbed to biomaterial surfaces. A spectral interpretation protocol was established by examining homopolymers of 16 amino acids. This protocol allows for the assignment of peaks unique to the various amino acids. Static SIMS was used to analyze plasma proteins adsorbed to titanium. The various factors that contributed to the relative intensities observed in the spectra were explored. The potential application of the technique for studying protein-fouled materials was investigated by analyzing a fouled sensor membrane.