3-D stimulated emission depletion microscopy with programmable aberration correction
3-D stimulated emission depletion microscopy with programmable aberration correction
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DOI：
10.1002/jbio.201300041
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发表时间：
2014-01-01
影响因子：
2.8
通讯作者：
French, Paul M. W.
中科院分区：
文献类型：
--
作者：
Lenz, Martin O.;Sinclair, Hugo G.;French, Paul M. W.
我们提出了一种受激发射耗尽（STED）显微镜，该显微镜通过同时耗尽光束提供3-D超分辨率，同时使用螺旋相位剖面增强横向分辨率，环形相位剖面增强轴向分辨率。三维耗尽点扩散函数是用一个空间光调制器实现的，该空间光调制器也可以通过编程来补偿显微镜和样品中的像差。我们应用它来展示一个自然杀伤细胞和它的靶细胞之间的免疫突触的第一个三维超分辨率成像。（(c) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim）
We present a stimulated emission depletion (STED) microscope that provides 3-D super resolution by simultaneous depletion using beams with both a helical phase profile for enhanced lateral resolution and an annular phase profile to enhance axial resolution. The 3-D depletion point spread function is realised using a single spatial light modulator that can also be programmed to compensate for aberrations in the microscope and the sample. We apply it to demonstrate the first 3-D super-resolved imaging of an immunological synapse between a Natural Killer cell and its target cell. ((c) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)