SPLAT II: An Aircraft Compatible, Ultra-Sensitive, High Precision Instrument for In-Situ Characterization of the Size and Composition of Fine and Ultrafine Particles
SPLAT II: An Aircraft Compatible, Ultra-Sensitive, High Precision Instrument for In-Situ Characterization of the Size and Composition of Fine and Ultrafine Particles
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SPLAT II：一种与飞机兼容的超灵敏高精度仪器，用于对细颗粒和超细颗粒的尺寸和成分进行原位表征
DOI：
10.1080/02786820802709243
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发表时间：
2009
影响因子：
5.2
通讯作者：
D. Imre
中科院分区：
文献类型：
--
作者：
A. Zelenyuk;Juan Yang;Eric Y. Choi;D. Imre
本文介绍了 SPLAT II，这是一种新型飞机兼容单粒子质谱仪，与 SPLAT 或任何其他现有的单粒子质谱仪相比，其性能显着提高。 SPLAT II 可检测并表征 100% 的球形颗粒和约 30% 的直径在 125 nm 至 600 nm 之间的非球形颗粒。它还显着提高了时间分辨率，每秒可测量超过 500 个粒子的大小，同时表征多达 100 个粒子的组成。对小颗粒灵敏度的提高使得在大多数情况下可以使用前置的微分迁移率分析仪 SPLAT II，以便同时测量除单个颗粒尺寸和成分之外的许多其他颗粒属性，例如密度或有效密度、动态形状因子、分形维数，甚至吸湿性。 SPLAT II 提供单层量级的尺寸精度，并且可以区分球形和非球形颗粒。 SPLAT II 使用两步、两激光过程来生成离子。半挥发性部分的质谱是通过气相中的电离产生的，减少了碎片并产生高度可重复的质谱，而难熔部分的质谱则通过烧蚀同时产生。仪器控制板为激光触发器生成与尺寸相关的延迟，以消除与尺寸相关的命中率，并以 14 位分辨率记录质谱。 SpectraMiner 和 ClusterSculptor 促进了数据分析；两个专门设计用于分析该仪器产生的大型数据集的视觉驱动软件包。
This article describes SPLAT II, a new aircraft compatible single particle mass spectrometer that provides significantly improved performance when compared with SPLAT, or any other existing single particle mass spectrometer. SPLAT II detects and characterizes 100% of spherical particles and ∼30% of aspherical particles with diameters between 125 nm and 600 nm. It also brings significant increase in temporal resolution, sizing over 500 particles per second, while characterizing the composition of up to 100 of them. The increase in sensitivity to small particles makes it possible, under most conditions, to use a differential mobility analyzer upfront SPLAT II in order to simultaneously measure in addition to individual particle size and composition, a number of other particle attributes, such as density or effective density, dynamic shape factor, fractal dimension, and even hygroscopicity. SPLAT II provides sizing precision on the order of a monolayer, and makes it possible to distinguish between spherical and aspherical particles. SPLAT II uses a two-step, two-laser process to generate ions. The mass spectra of the semivolatile fraction are generated by ionization in the gas phase, reducing fragmentation and yielding highly reproducible mass spectra, while the mass spectra of the refractory fraction are simultaneously generated by ablation. The instrument control board generates size-dependent delays for laser triggers to eliminate a size-dependent hit-rate and mass spectra are recorded with 14-bit resolution. Data analysis is facilitated by SpectraMiner and ClusterSculptor; two visually driven software packages specifically designed to analyze the large datasets that this instrument produces.