Measurement and simulative proof concerning the visibility loss in x-ray Talbot-Lau Moiré imaging
Measurement and simulative proof concerning the visibility loss in x-ray Talbot-Lau Moiré imaging
复制标题
X射线Talbot-Lau莫尔成像能见度损失的测量与模拟证明
DOI：
10.1088/1748-0221/12/12/t12007
复制
发表时间：
2017
影响因子：
1.3
通讯作者：
G. Anton
中科院分区：
文献类型：
--
作者：
M. Seifert;M. Gallersdörfer;F. Horn;V. Ludwig;M. Schuster;G. Pelzer;J. Rieger;T. Michel;G. Anton
基于x射线光栅的相衬成像技术是一种非常有前途的医学成像和无损检测成像技术。在得到衰减特性的同时，还可以得到物体的相移和散射特性的附加信息。然而，为了获得这些信息，必须在所谓的相位步进过程中对每张图像进行多次拍摄。因此，它通常是一个耗时的成像过程。相比之下，用塔尔博特-劳干涉仪成像是一种非常快速的单次成像方法。为了获得编码目标信息的莫尔条纹，干涉仪必须稍微失谐。与更耗时的相位步进方法相比，这会导致可见性的损失，从而导致图像质量的损失。因此，用红外成像方法来评估能见度损失的机制是非常重要的。在这篇文章中，我们提出了测量和模拟研究由于失谐塔尔博特-劳干涉仪的能见度损失。因此，可以更深入地了解摩尔成像。
X-ray grating-based phase-contrast imaging is a very promising imaging technique for medical imaging and non-destructive testing. Simultaneously to the attenuation properties additional information about the phase-shift and the scattering properties of an object can be gained. Nevertheless, to obtain this information multiple shots per image have to be taken in the so-called phase-stepping process. Thus, it often is a time consuming imaging procedure. In contrast, Moiré imaging with a Talbot-Lau interferometer is a very fast single-shot imaging method. To obtain the Moiré pattern which encodes the object information the interferometer has to be slightly detuned. This leads to a loss in visibility and therefore to a loss in image quality compared to the more time consuming phase-stepping method. Thus, it is important for the Moiré imaging method to evaluate the mechanisms of visibility loss. In this publication we present measurements and simulations investigating the visibility loss due to detuning the Talbot-Lau interferometer. Thus, a deeper understanding of Moiré imaging can be gained.
影响因子：
3.8
作者：
Bevins, Nicholas;Zambelli, Joseph;Chen, Guang-Hong
通讯作者：
Chen, Guang-Hong
影响因子：
3.8
作者：
Li, Ke;Ge, Yongshuai;Chen, Guang-Hong
通讯作者：
Chen, Guang-Hong
影响因子：
3.8
作者：
Bennett, Eric E.;Kopace, Rael;Wen, Han
通讯作者：
Wen, Han