Routine use of the crystal device integrity testing system in pediatric patients.
Routine use of the crystal device integrity testing system in pediatric patients.
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儿科患者常规使用晶体装置完整性测试系统。
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
Kevin H Franck
中科院分区：
文献类型：
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作者：
Daniel L Monin;K. Kazahaya;Kevin H Franck
晶体设备完整性测试系统（CITS），第一个商用测试系统的类型，允许快速评估人工耳蜗植入功能通过测量平均电极电压-电极电流产生的头皮记录场。我们描述了我们使用CITS对44例儿童人工耳蜗患者进行常规完整性测试的经验。我们将我们的研究结果集中在单极和共地扫描上，为将来评估CITS扫描提供一个框架。我们还描述了一些使用CITS的异常结果影响临床治疗的病例，证明了进行常规完整性测试的效用。
Crystal Device Integrity Testing System (CITS), the first commercially available testing system of its type, allows rapid assessment of cochlear implant function by measuring averaged electrode voltages-the scalp-recorded fields generated by electrode currents. We describe our experience performing routine integrity tests on 44 pediatric cochlear implant patients using the CITS. We present our findings focusing on the monopolar and common ground scans to provide a framework from which CITS scans can be evaluated in the future. We also describe selected cases in which abnormal results using the CITS influenced clinical treatment, demonstrating the utility of performing routine integrity tests.