Dynamics of electrons in drift detectors
Dynamics of electrons in drift detectors
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DOI：
10.1016/0168-9002(87)90522-5
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发表时间：
1987-01
影响因子：
1.4
通讯作者：
E. Gatti;A. Longoni;P. Řehák;M. Sampietro
中科院分区：
文献类型：
--
作者：
E. Gatti;A. Longoni;P. Řehák;M. Sampietro
研究了电离事件在硅漂移室中产生的电子的动力学。考虑了电子向阳极传输过程中的扩散效应、电子间的相互静电斥力以及耗尽场的聚焦特性。理论计算表明，即使在最小电离粒子穿过探测器300μm产生的电荷密度下，相互静电斥力对电荷包扩展的影响也是不可忽略的。实验结果支持理论预期。
The dynamics of electrons generated in silicon drift chambers by ionizing events is studied. Diffusion effects, mutual electrostatic repulsion between the electrons as well as the focusing properties of the depletion field during the electron transport to the anode are considered. The theoretical computations show that the effect of the mutual electrostatic repulsion in the spreading of the charge packet are not negligible even at charge densities produced by a minimum ionizing particle traversing 300 μm of the detector. Experimental results support theoretical expectations.