In Situ X-ray Scattering Studies of the Influence of an Additive on the Formation of a Low-Bandgap Bulk Heterojunction
In Situ X-ray Scattering Studies of the Influence of an Additive on the Formation of a Low-Bandgap Bulk Heterojunction
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DOI：
10.1021/acs.chemmater.6b05358
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发表时间：
2017-03-14
影响因子：
8.6
通讯作者：
Hexemer, Alexander
中科院分区：
文献类型：
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作者：
Bokel, Felicia A.;Engmann, Sebastian;Hexemer, Alexander
含有低带隙聚合物聚[(4,8-双[5-(2-乙基己基)噻吩-2基]苯并[1,2-b :4,5-b二噻吩e)-2,6-二基-a lt-(4-(2-乙基己基)噻吩基]高效、叶片涂层、有机光伏(OPV)活性层的形态演变[3,4-b]噻吩))-2,6-diy1] (PBDTTT-C-T) 通过原位 X 射线散射进行检查。原位研究能够实时表征加工添加剂 1,8-二碘辛烷 (DIO) 对活性层形态的影响。在 DIO 存在的情况下，X 射线散射表明域结构发生根本性变化并提高纯度，而 X 射线衍射显示结晶度/局部有序几乎没有变化。该活性层的固化行为与聚（3己基噻吩）和含有小分子的系统等强结晶的固化行为显着不同，从而暴露出与高效聚合物富勒烯 OPV 加工相关的固化路径的显着多样性。在 DIO 存在的情况下，我们发现小角 X 射线散射揭示的相结构的演化与简单 Flory Huggins 模型的双节相结构之间存在定量一致性。
The evolution of the morphology of a high -efficiency, blade -coated, organic -photovoltaic (OPV) active layer containing the low band gap polymer poly[(4,8-bis[5-(2-ethylhexyl)thiophene-2yl]benzo [1,2-b :4,5-b dithioph en e) -2,6-diyl-a lt-(4-(2-ethylh exan oyl) thieno [3,4-b]thiophene))-2,6-diy1] (PBDTTT-C-T) is examined by in situ X-ray scattering. In situ studies enable real-time characterization of the effect of the processing additive 1,8-diiodoocatane (DIO) on the active layer morphology. In the presence of DIO, X-ray scattering indicates that domain structure radically changes and increases in purity, while X-ray diffraction reveals little change in crystallinity/local order. The solidification behavior of this active layer differs dramatically from those that strongly crystallize such as poly(3hexylthiophene) and small molecule containing systems, exposing significant diversity in the solidification routes relevant to high-efficiency polymer fullerene OPV processing. In the presence of DIO, we find quantitative agreement between the evolution of the phase structure revealed by small -angle X-ray scattering and the binodal phase structure of a simple Flory Huggins model.