Ikuo IHARA: "Inverse Analysis with Surface Wave Spectrocsopy to Determine Material Properties of Thin Film on Substarate" Simulation of Materials Processing : Theory, Methods and Applications, A.A.Balkema, Rotterdam.575-581 (1995)

Ikuo IHARA: "Inverse Analysis with Surface Wave Spectrocsopy to Determine Material Properties of Thin Film on Substarate" Simulation of Materials Processing : Theory, Methods and Applications, A.A.Balkema, Rotterdam.575-581 (1995)
复制标题

Ikuo IHARA:“用表面波谱进行逆分析以确定基板上薄膜的材料特性”材料加工模拟:理论、方法和应用,A.A.Balkema,鹿特丹.575-581 (1995)

DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
--
中科院分区:
--
文献类型:
--
作者:

文献摘要

相似文献