Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction
Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction
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DOI：
10.1103/physrevlett.110.115501
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发表时间：
2013-03-11
影响因子：
8.6
通讯作者：
Wark, J. S.
中科院分区：
文献类型：
--
作者：
Comley, A. J.;Maddox, B. R.;Wark, J. S.
冲击加载的单晶钽[100]的强度已经通过使用现场宽带X射线劳厄衍射来测量压缩晶体的应变状态以及根据第一原理计算的弹性常数来实验确定。在冲击压力为181 GPa时，强度可达35 GPa，与多尺度强度模型[N. R.巴顿等人，J. Appl. Phys. 109，073501（2011）]，其在一定范围的长度尺度上采用模拟方法的层次结构来根据第一原理计算强度。DOI：10.1103/PhysRevLett.110.115501
The strength of shock-loaded single crystal tantalum [100] has been experimentally determined using in situ broadband x-ray Laue diffraction to measure the strain state of the compressed crystal, and elastic constants calculated from first principles. The inferred strength reaches 35 GPa at a shock pressure of 181 GPa and is in excellent agreement with a multiscale strength model [N. R. Barton et al., J. Appl. Phys. 109, 073501 (2011)], which employs a hierarchy of simulation methods over a range of length scales to calculate strength from first principles. DOI: 10.1103/PhysRevLett.110.115501